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Project description

Partners

Alstom Rail Sweden ABCarl Zeiss Microscopy GmbHEricsson ABEurofins MASER B.VFraunhofer IMWSGimic ABInfineon Technologies AGMatworks GmbHNXP Semiconductors Netherlands BVPVA TePla Analytical Systems GmbHRISE Research Institutes of Sweden ABRobert Bosch GmbHSTMicroelectronics (Rousset) SASSTMicroelectronics Grenoble 2 SASUniversity of Stuttgart

Countries involved

Ref:

2023042

Status:

Running

Project leaders:

Klaus Pressel

Abstract

The FA2IR project will investigate important applications of Artificial Intelligence (AI) methods to databases in microelectronic failure analysis (FA). The target is to get these FA databases AI-ready and to develop improved FA4.0-AI-based methods, e.g. for image and measurement data analysis, text classification, etc. Although AI is the subject of various FA-related publications, the approach of this project regarding the database landscape is unique due to the implementation of the FAIR-data principle (Findable, Accessible, Interoperable, Reusable). This work will include deep-dive data evaluation, e.g. finding and labeling failures in images as well as finding analysis reports describing them. The novel methods will result in shorter development times for new products, a faster and exacter reaction to field failures, as well as improved collaboration between partners of the value chain by an open approach.
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